Panalytical X’Pert Pro MPD Alpha1 Diffractometer

Image of the Panalytical Scanning Diffractometer X’Pert Pro MPD Alpha1

X’Pert Pro MPD Alpha1

Instrument features

  • Primary monochromator and para-focussing optics for high-resolution measurements - Co or Cu radiation.
  • Reflection and transmission geometry.
  • Used for structural characterisation of powdered samples (Rietveld analysis): lattice parameters, crystallite size, microstrain analysis.

Examples of instrument use in research

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